US imported molecular beam epitaxy (MBE) equipment for epitaxial growth of high-quality single crystal films
Oxide Film Deposition System -- Pulsed Laser Deposition (PLD)
Hall test system
Semiconductor parameter test system-KEITHLEY 4200
A powerful method for semiconductor impurity defect properties and spectroscopic research---low temperature steady-state/transient fluorescence spectrometer (Photoluminescence)
Advanced Semiconductor Thin Film Research Group | Zhejiang University
Tel: 86-0571-87952625 | Email: yezz@zju.edu.cn
Office: Room 232, Hetong Complex Building 10, Zijingang Campus, Zhejiang University 浙ICP备2021012855号-1